DocumentCode
912536
Title
Simulation of Heavy Charged Particle Tracks Using Focused Laser Beams
Author
Richter, A.K. ; Arimura, I.
Author_Institution
Boeing Aerospace Company P. O. Box 3999 Seattle, WA. 98124
Volume
34
Issue
6
fYear
1987
Firstpage
1234
Lastpage
1239
Abstract
A laboratory system utilizing a Q-switched Nd-doped YAG laser is used to simulate the ionization track produced as energetic heavy ions traverse a semiconductor device (resulting in single-event upset effects). Details of the optical design for producing the precisely focused spot and the requirements for fast pulses are described. The advantages and disadvantages of the use of this laboratory simulation are discussed. Laser tests on PIN diodes, p-n junctions, bipolar memories, and power MOSFETs are described and compared to high energy particle tests results.
Keywords
Ionization; Laboratories; Laser beams; Optical design; Optical pulses; Particle beams; Particle tracking; Semiconductor devices; Semiconductor lasers; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1987.4337458
Filename
4337458
Link To Document