Quantitative Evaluation of Self-Checking Circuits

Author

Lu, David Jun ; McCluskey, Edward J.

Author_Institution

Center for Reliable Computing, Computer Systems Laboratory, Department of Electrical Engineering and Computer Science, Stanford, CA, USA

Volume

3

Issue

2

fYear

1984

fDate

4/1/1984 12:00:00 AM

Firstpage

150

Lastpage

155

Abstract

Quantitative measures of self-checking power are defined for evaluation, comparison, and design of self-checking circuits. The self-testing and fault-secure properties have the corresponding quantitative measures testing input fraction (TIF), and secure input fraction (SIF). Averaging these measures over the fault set yields basic figures of merit. These simple averages can conceal faults with low values of TIF or SIF. Improved figures of merit, based on geometric means, are defined to provide greater sensitivity to low TIF or SIF. As a demonstration, self-checking linear feedback shift registers (LFR´s) based on duplication and serial parity prediction are evaluated.

Keywords

CRC; LFSR; SIF; SIFBAR; SIFGM; TIF; TIFBAR; TIFGM; duplication; encoder; figures of merit; histogram; measures; parity; quantitative; self-checking; shift register; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Contracts; Cyclic redundancy check; Linear feedback shift registers; Military computing; Power measurement; Shift registers;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/TCAD.1984.1270069

Filename

1270069