Hard Error Generation by Neutron-Induced Fission Fragments

Author

Browning, J.S. ; Gover, J.E. ; Wrobel, T.F. ; Hass, K.J. ; Nasby, R.D. ; Simpson, R.L. ; Posey, L.D. ; Boos, R.E. ; Block, R.C.

Volume

Issue

fYear

1987

Firstpage

1269

Lastpage

1274

Keywords

Capacitors; Ceramics; Detectors; Inductors; Insulation life; Nonvolatile memory; Packaging; Pollution measurement; Random access memory; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

DOI

10.1109/TNS.1987.4337464

Filename

4337464

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