• DocumentCode
    912608
  • Title

    F.m. noise measurements on silicon IMPATT oscillators

  • Author

    Clunie, D.M. ; Tearle, C.A. ; Court, W.P.N.

  • Author_Institution
    Services Electronics Research Laboratory, Baldock, UK
  • Volume
    7
  • Issue
    2
  • fYear
    1971
  • Firstpage
    39
  • Lastpage
    40
  • Abstract
    The view has often been expressed that IMPATT oscillators have poor f.m. noise performance. This letter gives results of f.m. noise measurements on J band IMPATT oscillators which indicate that, with suitable cavity and diode design, good f.m. noise performance can be obtained.
  • Keywords
    IMPATT devices; frequency modulation; microwave oscillators; noise measurement; FM noise measurement; IMPATT oscillators; J-band; Si; microwave oscillators;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19710029
  • Filename
    4235134
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=912608