• DocumentCode
    912712
  • Title

    Recent Trends in Parts SEU Susceptibility from Heavy Ions

  • Author

    Nichols, D.K. ; Smith, L.S. ; Price, W.E. ; Koga, R. ; Kolasinski, W.A.

  • Author_Institution
    Jet Propulsion Laboratory California Institute of Technology Pasadena, California
  • Volume
    34
  • Issue
    6
  • fYear
    1987
  • Firstpage
    1332
  • Lastpage
    1337
  • Abstract
    JPL and Aerospace have collected an extensive set of heavy ion single event upset (SEU) test data since their last joint publication in December, 1985. Trends in SEU susceptibility for state-of-the-art parts are presented.
  • Keywords
    Aerospace electronics; Aerospace testing; Extraterrestrial measurements; MOS devices; Manufacturing; PROM; Propulsion; Random access memory; Satellites; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1987.4337475
  • Filename
    4337475
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=912712