Title :
Number of pattern classifier design samples per class (Corresp.)
fDate :
9/1/1969 12:00:00 AM
Keywords :
Pattern classification; Bayesian methods; Gaussian distribution; Logic testing; Mathematical model; Parameter estimation; Pattern analysis; Pattern classification; Random processes; Size measurement;
Journal_Title :
Information Theory, IEEE Transactions on
DOI :
10.1109/TIT.1969.1054352
