The investigation of surface characteristics and contact resistance of DC relay contacts

Author

Chen, Zhuan-Ke ; Sawa, Koichiro

Author_Institution

Dept. of Electr. Eng., Keio Univ., Yokohama, Japan

Volume

16

Issue

2

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

211

Lastpage

219

Abstract

Examination of the contact morphology, surface composition, and contact resistance of DC relay contacts for two levels of low-current (less than 1 A) arc has shown that a similar contact erosion mechanism and similar contact resistance degradation exist for 0.5- and 0.75-A switching resistor loads. Material transfer is attributed to ion sputtering during arcing, as is the degradation of contact resistance determined at different operating cycles, which appears to be influenced by both the contact morphology and surface contamination. A simple model is introduced and used to explain the process of arc erosion and contact resistance degradation during testing

Keywords

circuit-breaking arcs; contact resistance; electrical contacts; relays; surface structure; 0.5 A; 0.75 A; Auger electron spectra; DC relay contacts; arc erosion; arcing; contact erosion mechanism; contact morphology; contact resistance degradation; ion sputtering; low current arc; material transfer; surface composition; surface contamination; switching resistor loads; testing; Contact resistance; Degradation; Electrodes; Relays; Resistors; Sputtering; Surface contamination; Surface morphology; Surface resistance; Testing;

fLanguage

English

Journal_Title

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on

Publisher

ieee

ISSN

0148-6411

Type

jour

DOI

10.1109/33.219407

Filename

219407