Title :
Lucky drift models of multilayered structures and approximate forms of lucky drift expressions
Author :
Marsland, J.S. ; Woods, R.C.
Author_Institution :
University of Sheffield, Department of Electronic & Electrical Engineering, Sheffield, UK
fDate :
12/1/1987 12:00:00 AM
Abstract :
An approximate form of the lucky drift expression for ionisation coefficients is presented. This simplified expression enables analytic calculation of the ionisation coefficients in staircase avalanche photodiode structures using some approximations. The ionisation coefficients in superlattice avalanche photodiodes are calculated in the same manner. The results for both these structures are compared with other theories and with experimental observations.
Keywords :
avalanche photodiodes; ionisation of solids; analytic calculation; ionisation coefficients; lucky drift expressions; lucky drift model; multilayered structures; semiconductor devices; staircase avalanche photodiode structures; superlattice avalanche photodiodes;
Journal_Title :
Optoelectronics, IEE Proceedings J
DOI :
10.1049/ip-j.1987.0051
