DocumentCode :
912839
Title :
Timing and Area Optimization of CMOS Combinational-Logic Circuits Accounting for Total-Dose Radiation Effects
Author :
Gyurcsik, R.S. ; Thomas, D.W. ; Gallimore, R.H. ; Bhuva, B.L. ; Kerns, S.E.
Author_Institution :
Department of Electrical and Computer Engineering Box 7911 North Carolina State University Raleigh, North Carolina 27695-7911
Volume :
34
Issue :
6
fYear :
1987
Firstpage :
1386
Lastpage :
1391
Abstract :
An algorithm for optimMOL VLSI´ NX1SI combinational logic circuits for operation in total-dose environments is presented. The width-to-length ratios of the MOS transistors are determined which allow the circuit to meet specified timing requirements while minimizing circuit area. The logic circuit is modeled by an equivalent resistor-capacitor (RC) network, where the resistors and capacitors are functions of transistor width-to-length ratios. The total-dose radiation dependence is modeled as a variation in the resistors. The algorithm has been implemented and tested on example circuits, and the results have been verified using SPICE.
Keywords :
Circuit testing; Combinational circuits; Logic circuits; MOS capacitors; MOSFETs; Radiation effects; Resistors; Semiconductor device modeling; Timing; Very large scale integration;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1987.4337485
Filename :
4337485
Link To Document :
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