• DocumentCode
    912839
  • Title

    Timing and Area Optimization of CMOS Combinational-Logic Circuits Accounting for Total-Dose Radiation Effects

  • Author

    Gyurcsik, R.S. ; Thomas, D.W. ; Gallimore, R.H. ; Bhuva, B.L. ; Kerns, S.E.

  • Author_Institution
    Department of Electrical and Computer Engineering Box 7911 North Carolina State University Raleigh, North Carolina 27695-7911
  • Volume
    34
  • Issue
    6
  • fYear
    1987
  • Firstpage
    1386
  • Lastpage
    1391
  • Abstract
    An algorithm for optimMOL VLSI´ NX1SI combinational logic circuits for operation in total-dose environments is presented. The width-to-length ratios of the MOS transistors are determined which allow the circuit to meet specified timing requirements while minimizing circuit area. The logic circuit is modeled by an equivalent resistor-capacitor (RC) network, where the resistors and capacitors are functions of transistor width-to-length ratios. The total-dose radiation dependence is modeled as a variation in the resistors. The algorithm has been implemented and tested on example circuits, and the results have been verified using SPICE.
  • Keywords
    Circuit testing; Combinational circuits; Logic circuits; MOS capacitors; MOSFETs; Radiation effects; Resistors; Semiconductor device modeling; Timing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1987.4337485
  • Filename
    4337485