DocumentCode
912929
Title
Three-Dimensional Monte Carlo Simulations--Part II: Recoil Phenomena
Author
Mazzone, Anna M.
Author_Institution
CNR-Institute LAMEL, Bologna, Italy
Volume
4
Issue
1
fYear
1985
fDate
1/1/1985 12:00:00 AM
Firstpage
110
Lastpage
117
Abstract
A Monte Carlo method has been applied to recoil calculation. The spatial distribution of disorder has been analyzed in connection with parameters like ion mass, energy, and dose. Also implants in multilayer targets and the characteristic features of oxygen recoiling from a SiO 2 coating into Si underneath have been analyzed.
Keywords
Annealing; Coatings; Furnaces; Implants; Ion implantation; Lattices; Monte Carlo methods; Nonhomogeneous media; Semiconductor devices; Semiconductor impurities;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.1985.1270103
Filename
1270103
Link To Document