Radiation-Induced Response of Operational Amplifiers in Low-Level Transient Radiation Environments

Extensive computer simulations have been performed on CMOS and bipolar operatioinal amplifiers in an attempt to obtain a better understanding of low-level transient radiation response mechanisms. The simulation methodology has been confirmed using flash X-ray data for the amplifiers studied. Variations in circuit response to loading and feedback configuration have been explored, and several generalizations can be made which may provide a useful basis for a specification methodology.