Title :
Characterization of an Ultra-Hard CMOS 64K Static RAM
Author :
Jenkins, William C. ; Martin, Richard L. ; Hughes, Harold L.
Author_Institution :
Naval Research Laboratory Washington, D. C. 20375
Abstract :
We have irradiated radiation-hard 64K CMOS Static RAMs in a 60Co pool at dose rates of 3 and 70 Rads-(SiO2)/sec to simulate a space radiation environment. The devices failed due to write-failure at a total gamma dose in some cases greater than 50 MRads(SiO2). Test Transistors were also irradiated and measured.
Keywords :
Bonding; Failure analysis; Laboratories; Performance evaluation; Random access memory; Read-write memory; Semiconductor device measurement; Testing; Time measurement; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1987.4337497
