• DocumentCode
    913231
  • Title

    A Simulation Method to Completely Model the Various Transistor I-V Operational Modes of Long Channel Depletion MOSFET´s

  • Author

    Chiang, Min-Wen ; Junior, J.C. ; Kao, Chuck

  • Author_Institution
    Xerox Corporation, El Segundo, CA , USA
  • Volume
    4
  • Issue
    3
  • fYear
    1985
  • fDate
    7/1/1985 12:00:00 AM
  • Firstpage
    322
  • Lastpage
    328
  • Abstract
    It is known that a depletion MOS device behaves quite differently from an enhancement device. Because of its intrinsic difference, depletion I-V characteristics are much more complicated than are the I-V functions of an enhancement MOSFET. The conventional transistor I-V equation developed for enhancement transistors cannot be applied directly to depletion transistors. In this paper, seven operating modes a depletion device can have are discussed. The concept of extended depletion regions is introduced to calculate transistor I-V characteristics. A graphical representation of the universal channel depth versus the channel potential is proposed to help in understanding the engineering significance of operational modes depletion devices can assume. A flowchart is developed to calculate the depletion transistor I-V characteristics. The simulation and analysis aid can be easily adapted to computer-oriented circuit and device investigations.
  • Keywords
    Analytical models; Circuit simulation; Computational modeling; Computer simulation; Equations; Flowcharts; MOS devices; MOSFET circuits; Substrates; Voltage;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.1985.1270128
  • Filename
    1270128