Title :
A Simulation Method to Completely Model the Various Transistor I-V Operational Modes of Long Channel Depletion MOSFET´s
Author :
Chiang, Min-Wen ; Junior, J.C. ; Kao, Chuck
Author_Institution :
Xerox Corporation, El Segundo, CA , USA
fDate :
7/1/1985 12:00:00 AM
Abstract :
It is known that a depletion MOS device behaves quite differently from an enhancement device. Because of its intrinsic difference, depletion I-V characteristics are much more complicated than are the I-V functions of an enhancement MOSFET. The conventional transistor I-V equation developed for enhancement transistors cannot be applied directly to depletion transistors. In this paper, seven operating modes a depletion device can have are discussed. The concept of extended depletion regions is introduced to calculate transistor I-V characteristics. A graphical representation of the universal channel depth versus the channel potential is proposed to help in understanding the engineering significance of operational modes depletion devices can assume. A flowchart is developed to calculate the depletion transistor I-V characteristics. The simulation and analysis aid can be easily adapted to computer-oriented circuit and device investigations.
Keywords :
Analytical models; Circuit simulation; Computational modeling; Computer simulation; Equations; Flowcharts; MOS devices; MOSFET circuits; Substrates; Voltage;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.1985.1270128