DocumentCode
913231
Title
A Simulation Method to Completely Model the Various Transistor I-V Operational Modes of Long Channel Depletion MOSFET´s
Author
Chiang, Min-Wen ; Junior, J.C. ; Kao, Chuck
Author_Institution
Xerox Corporation, El Segundo, CA , USA
Volume
4
Issue
3
fYear
1985
fDate
7/1/1985 12:00:00 AM
Firstpage
322
Lastpage
328
Abstract
It is known that a depletion MOS device behaves quite differently from an enhancement device. Because of its intrinsic difference, depletion I-V characteristics are much more complicated than are the I-V functions of an enhancement MOSFET. The conventional transistor I-V equation developed for enhancement transistors cannot be applied directly to depletion transistors. In this paper, seven operating modes a depletion device can have are discussed. The concept of extended depletion regions is introduced to calculate transistor I-V characteristics. A graphical representation of the universal channel depth versus the channel potential is proposed to help in understanding the engineering significance of operational modes depletion devices can assume. A flowchart is developed to calculate the depletion transistor I-V characteristics. The simulation and analysis aid can be easily adapted to computer-oriented circuit and device investigations.
Keywords
Analytical models; Circuit simulation; Computational modeling; Computer simulation; Equations; Flowcharts; MOS devices; MOSFET circuits; Substrates; Voltage;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.1985.1270128
Filename
1270128
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