DocumentCode
913274
Title
Electron-Beam Apparatus for Testing Lwir Detectors in a Cryogenically Shielded Environment
Author
Flesner, L.D. ; Clement, R.E. ; Dahle, R.N. ; Bates, R.L. ; Arrington, D.C. ; Eisenman, W.L.
Author_Institution
Naval Ocean Systems Center, Electronic Material Sciences Division, Code 56 San Diego, California 92152-5000 (619) 225-6591
Volume
34
Issue
6
fYear
1987
Firstpage
1602
Lastpage
1604
Abstract
A Scanning Electron Microscope (SEM) has been modified to probe infrared detectors operating in a cryogenically shielded environment. A reduced infrared photon background is obtained by incorporating the SEM objective aperture as part of a liquid helium cooled radiation shield which surrounds the device under test. Use of this equipment will facilitate determination of the response mechanisms of long wavelength detectors to ionizing radiation.
Keywords
Apertures; Cryogenics; Helium; Infrared detectors; Ionizing radiation; Lenses; Radiation detectors; Scanning electron microscopy; Testing; Working environment noise;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1987.4337523
Filename
4337523
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