• DocumentCode
    913274
  • Title

    Electron-Beam Apparatus for Testing Lwir Detectors in a Cryogenically Shielded Environment

  • Author

    Flesner, L.D. ; Clement, R.E. ; Dahle, R.N. ; Bates, R.L. ; Arrington, D.C. ; Eisenman, W.L.

  • Author_Institution
    Naval Ocean Systems Center, Electronic Material Sciences Division, Code 56 San Diego, California 92152-5000 (619) 225-6591
  • Volume
    34
  • Issue
    6
  • fYear
    1987
  • Firstpage
    1602
  • Lastpage
    1604
  • Abstract
    A Scanning Electron Microscope (SEM) has been modified to probe infrared detectors operating in a cryogenically shielded environment. A reduced infrared photon background is obtained by incorporating the SEM objective aperture as part of a liquid helium cooled radiation shield which surrounds the device under test. Use of this equipment will facilitate determination of the response mechanisms of long wavelength detectors to ionizing radiation.
  • Keywords
    Apertures; Cryogenics; Helium; Infrared detectors; Ionizing radiation; Lenses; Radiation detectors; Scanning electron microscopy; Testing; Working environment noise;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1987.4337523
  • Filename
    4337523