Mean field annealing (MFA) and optimal design of electromagnetic devices

Author

Rao, Liyun ; Yan, Weili ; He, Renjie

Author_Institution

Dept. of Electr. Eng., Hebei Univ. of Technol., Tianjin, China

Volume

32

Issue

3

fYear

1996

fDate

5/1/1996 12:00:00 AM

Firstpage

1218

Lastpage

1221

Abstract

This paper presents an optimal design method by means of mean field annealing (MFA). The mean field theory (MFT) is introduced, and a certain MFA application extension based on Peierls inequality is explained in detail, the critical temperature that is important for classes of problem while applying MFA is discussed. With MFA, the optimal size design of electromagnetic device is carried out. The results are compared with two existing algorithms, the modified simulated annealing (MSA) and one-variable stochastic simulated annealing based MFA (S-MFA), in both operating cost and final quantities. To modify the final results to reach the global optimum, Hooke-Jeeves pattern search method is adopted. Favorable results show the effectiveness of the proposed scheme

Keywords

electrical engineering; electrical engineering computing; electromagnetic devices; search problems; simulated annealing; stochastic processes; AC contactor; Hooke-Jeeves pattern search method; Peierls inequality; S-MFA; algorithms; critical temperature; electromagnetic devices; global optimum; mean field annealing; mean field theory; modified simulated annealing; one-variable stochastic simulated annealing; operating cost; optimal size design; Costs; Design methodology; Electromagnetic devices; Electromagnetic fields; Equations; Helium; Paper technology; Search methods; Simulated annealing; Stochastic processes; Temperature;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.497463

Filename

497463