Title :
Mean field annealing (MFA) and optimal design of electromagnetic devices
Author :
Rao, Liyun ; Yan, Weili ; He, Renjie
Author_Institution :
Dept. of Electr. Eng., Hebei Univ. of Technol., Tianjin, China
fDate :
5/1/1996 12:00:00 AM
Abstract :
This paper presents an optimal design method by means of mean field annealing (MFA). The mean field theory (MFT) is introduced, and a certain MFA application extension based on Peierls inequality is explained in detail, the critical temperature that is important for classes of problem while applying MFA is discussed. With MFA, the optimal size design of electromagnetic device is carried out. The results are compared with two existing algorithms, the modified simulated annealing (MSA) and one-variable stochastic simulated annealing based MFA (S-MFA), in both operating cost and final quantities. To modify the final results to reach the global optimum, Hooke-Jeeves pattern search method is adopted. Favorable results show the effectiveness of the proposed scheme
Keywords :
electrical engineering; electrical engineering computing; electromagnetic devices; search problems; simulated annealing; stochastic processes; AC contactor; Hooke-Jeeves pattern search method; Peierls inequality; S-MFA; algorithms; critical temperature; electromagnetic devices; global optimum; mean field annealing; mean field theory; modified simulated annealing; one-variable stochastic simulated annealing; operating cost; optimal size design; Costs; Design methodology; Electromagnetic devices; Electromagnetic fields; Equations; Helium; Paper technology; Search methods; Simulated annealing; Stochastic processes; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on