DocumentCode :
913455
Title :
Current Lines and Accurate Contact Current Evaluation in 2-D Numerical Simulation of Semiconductor Devices
Author :
Palm, Erich ; Van de Wiele, Fernand
Author_Institution :
EUROTECHNIQUE -- Thomson Semiconductors, F-13790 Rousset, France
Volume :
4
Issue :
4
fYear :
1985
fDate :
10/1/1985 12:00:00 AM
Firstpage :
496
Lastpage :
503
Abstract :
The conservation of the total current density in semiconductor devices implies that the current derives from a vector potential. The calculation of this current potential is a dual problem of the original device simulation problem. A simple and elegant discrete method is proposed for the 2-D case, which yields the current potential for a given, numerically calculated current density. The approach is based upon a least squares principle and is consistent with the assumptions leading to the discrete formulation of the semiconductor transport equations. Accurate values of the contact currents are obtained and a simple way to generate representations of current lines becomes available. The method has the advantage that it does not require any definition of paths for the integration of current files.
Keywords :
AC generators; Boundary conditions; Construction industry; Current density; Current distribution; Lead compounds; Least squares methods; Numerical simulation; Partial differential equations; Semiconductor devices;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.1985.1270148
Filename :
1270148
Link To Document :
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