• DocumentCode
    913471
  • Title

    A Framework for an Integrated Set of Standards for Ionizing Radiation Testing of Microelectronics

  • Author

    Brown, Dennis B. ; Johnston, Allan H.

  • Author_Institution
    Condensed Matter Physics Branch Naval Research Laboratory Washington, DC 20375
  • Volume
    34
  • Issue
    6
  • fYear
    1987
  • Firstpage
    1719
  • Lastpage
    1725
  • Abstract
    Post irradiation effects necessitate modifications to total dose testing procedures. A test methodology based on three options is proposed: (a) Test Method 1019, (b) Method 1019 with safety factors, (c) and a new test method based on extrapolation from measurements to effects expected at time of threat.
  • Keywords
    Annealing; Extrapolation; Ionizing radiation; Laboratories; Microelectronics; Physics; Radiation safety; Space technology; Testing; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1987.4337543
  • Filename
    4337543
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=913471