Title :
Total-Dose Hardness Assurance for Low Earth Orbit
Author :
Maurer, R.H. ; Suter, J.J.
Author_Institution :
The Johns Hopkins University Applied Physics Laboratory Laurel, Maryland 20707
Abstract :
The Low Earth Orbit radiation environment has two significant characteristics that make laboratory simulation exposures difficult: (1) a low dose rate and (2) many cycles of low dose accumulation followed by dose-free annealing. Hardness assurance considerations for this environment are discussed and related to data from the testing of Advanced Low Power Schottky and High-speed CMOS devices.
Keywords :
Acceleration; Aluminum; Integrated circuit manufacture; Logic devices; Logic testing; Low earth orbit satellites; MOS devices; Physics; Simulated annealing; Threshold voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1987.4337550
