• DocumentCode
    913621
  • Title

    SEU Sensitivity of Power Converters with MOSFETs in Space

  • Author

    Brucker, G.J. ; Measel, P. ; Oberg, D. ; Wert, J. ; Criswell, T.

  • Author_Institution
    RCA/GE Astro-Space Division P.O. Box 800 Princeton, N.J. 08543-0800
  • Volume
    34
  • Issue
    6
  • fYear
    1987
  • Firstpage
    1792
  • Lastpage
    1795
  • Abstract
    This paper presents the results of an investigation into the survivability of power MOSFETs in space. Seventy-two of these devices are presently in geosynchronous orbit on board six communications spacecraft, and operating at 70V which is 70% of the nominal breakdown voltage. No failures have occurred after 94536 device-days in space. The irradiation of discrete parts as well as the prototype flight power converter, containing the same part types, by iron particles with a LET of 10 MeV-cm2/mg, and an iron spectrum with a maximum LET of 26 showed these Hi-Rel ("S") flight parts to be relatively harder than the same type of devices previously ground tested. This appears to be the explanation for the lack of failures in space.
  • Keywords
    Aerospace electronics; Assembly; Breakdown voltage; Circuits; Iron; MOSFETs; Power supplies; Prototypes; Space vehicles; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1987.4337556
  • Filename
    4337556