DocumentCode :
913824
Title :
Improved distance measure for pattern recognition
Author :
Batchelor, B.G.
Author_Institution :
University of Southampton, Department of Electronics, Southampton, UK
Volume :
7
Issue :
18
fYear :
1971
Firstpage :
521
Lastpage :
524
Abstract :
The Euclidean distance has often been used to measure the similarity between patterns represented by multidimensional vectors. The Euclidean distance is expensive to implement in hardware, and alternatives have been sought. The letter proposes a new distance measure which is a weighted sum of the city block and square distances. This new distance is a more accurate predictor of the Euclidean distance than are either of its components.
Keywords :
distance measurement; pattern recognition; Euclidean distance; distance measurement; multidimensional vectors; pattern recognition;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19710353
Filename :
4235253
Link To Document :
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