• DocumentCode
    913982
  • Title

    Standard Description Form for Device Characteristics in VLSI´s

  • Author

    Sugimoto, Masunori ; Fukuma, Masao

  • Author_Institution
    Microelectronics Research Laboratories, NEC Corporation, Miyamaeku, Kawasaki, Japan
  • Volume
    5
  • Issue
    2
  • fYear
    1986
  • fDate
    4/1/1986 12:00:00 AM
  • Firstpage
    293
  • Lastpage
    302
  • Abstract
    A standard form is presented for describing device characteristics in VLSI´s. It serves as a standard interchange form for device characteristics between various design tools for VLSI´s. The form is designed such that any relevant characteristic as a circuit component can be described. It also makes it possible to process an enormous amount of device data efficiently. A newly developed CAD system, which integrates device and circuit simulators, is also presented as a standard form application example. Any device simulator, which has outputs in the standard form, can be implemented into the system. By using the standard form, various device simulators are able to be used in total LSI design systems, which makes it possible to execute accurate simulations and designs for LSI using recent fine pattern technologies.
  • Keywords
    Breakdown voltage; Circuit simulation; Circuit testing; Design automation; Large scale integration; Parameter extraction; Process design; Standardization; Standards development; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.1986.1270198
  • Filename
    1270198