Finite element analysis for power electronics EMC applications

Author

Sitzia, A.M. ; Baker, A.E. ; Preston, T.W. ; Puzo, A. ; Pons, A.

Author_Institution

Eng. Res. Centre, GEC Alsthom, Stafford, UK

Volume

32

Issue

3

fYear

1996

fDate

5/1/1996 12:00:00 AM

Firstpage

1517

Lastpage

1520

Abstract

A CAD system for the analysis of power electronic circuits for EMC applications is being developed. The system is based on 3-dimensional finite-element electromagnetic field computations, with the source currents or voltages extracted either from measurements or from standard circuit analysis. The finite-element solver for this application is configured in terms of magnetic vector potential (A_) and modified electric scalar potential (V´), incorporating, unusually, the Coulomb gauge ∇.A_=0. Comparisons of computed electromagnetic fields with measurements of fields emitted from a 600 V, 300 A IGBT switching circuit are reported. Agreement in magnetic field strength is fair (within 8 dBμA/m) at the low frequencies (10 kHz-20 kHz) considered

Keywords

bipolar transistor switches; circuit analysis computing; electric field measurement; electromagnetic compatibility; electromagnetic fields; finite element analysis; insulated gate bipolar transistors; magnetic field measurement; power bipolar transistors; power semiconductor switches; 10 to 20 kHz; 300 A; 3D finite-element EM field computations; 600 V; CAD system; Coulomb gauge; EM filed measurements; EMC applications; IGBT switching circuit; circuit analysis; electromagnetic fields; finite element analysis; finite-element solver; low frequencies; magnetic field strength; magnetic vector potential; modified electric scalar potential; power electronic circuits; source currents; source voltages; Circuit analysis computing; Current measurement; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic measurements; Finite element methods; Magnetic analysis; Magnetic field measurement; Power electronics; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.497538

Filename

497538