DocumentCode :
914279
Title :
Measurement of Surface Resistance in Oversized Circular Waveguide at Millimeter Wavelengths (Short Papers)
Author :
Hatano, Satomi ; Nihei, Fumihiro
Volume :
24
Issue :
11
fYear :
1976
fDate :
11/1/1976 12:00:00 AM
Firstpage :
886
Lastpage :
887
Abstract :
The increase of the surface resistance of oversized circular waveguides has been accurately evaluated at millimeter wavelengths by measuring attenuations of TE0n modes. The ratios of the effective resistances to the ideal resistances of the wall were found to be 1.27, 1.42, and 1.54 at 40, 60, and 80 GHz, respectively.
Keywords :
Attenuation; Dielectric loss measurement; Electrical resistance measurement; Millimeter wave measurements; Permittivity measurement; Rough surfaces; Surface resistance; Surface roughness; Surface waves; Wavelength measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1976.1128987
Filename :
1128987
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=914279
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