Title :
C-Testability of Two-Dimensional Iterative Arrays
Author :
Elhuni, Hasan ; Vergis, Anastasios ; Kinney, Larry
Author_Institution :
Department of Electrical Engineering, University of Minnesota, Minneapolis, MN, USA
fDate :
10/1/1986 12:00:00 AM
Abstract :
The issue of testing two-dimensional iterative arrays with a constant number of test vectors independent of the array size (C-testability) is discussed in this paper. Sufficient conditions for C-testability are stated. It is shown that any two-dimensional array can be modified to become C-testable. An extension to systolic (synchronous) arrays is made. The approach simplifies testing systolic arrays by using one test vector to test many cells of the array in a periodic fashion. A two-dimensional array for matrix multiplication is used to illustrate the approach for systolic arrays.
Keywords :
Computer science; Convolution; Design automation; Ear; Fault detection; Iterative methods; Sufficient conditions; System testing; Systolic arrays; Very large scale integration;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.1986.1270228