• DocumentCode
    914355
  • Title

    PLATYPUS: A PLA Test Pattern Generation Tool

  • Author

    Wei, Ruey-Sing ; Sangiovanni-Vincentelli, Alberto

  • Author_Institution
    Department of Electrical Engineering and Computer Science, University of California, Berkeley, CA, USA
  • Volume
    5
  • Issue
    4
  • fYear
    1986
  • fDate
    10/1/1986 12:00:00 AM
  • Firstpage
    633
  • Lastpage
    644
  • Abstract
    PLATypus (PLA Test pattern generation and logic simulation tool) is an efficient tool for large PLA\´s which is interfaced with other existing PLA tools such as the folding program PLEASURE [12] and the logic minimizer ESPRESSO II-C [11] developed at the University of California at Berkeley. A new algorithm is proposed based on complementation and the tautology check of a logic cover, derived from the PLA personality matrix. Both complementation and tautology check are performed by advanced logic manipulation algorithms used in the logic minimization program ESPRESSO II-C [11]. The algorithm is exact, i.e., every testable crosspoint fault is tested, and maximum fault coverage is guaranteed. A quick preprocess, the biased random test generation, is used followed by the proposed algorithm to achieve the best balance between run time and test-set compactness. The program is refined at various stages by many powerful heuristics in the area of fault processing order, backend fault simulation, "don\´t-care" bit fixing, and on-the-fly test compaction. Both single stuck-at and crosspoint fault models are supported. PLATYPUS can also be used as a logic simulation tool and redundancy identifier. Test pattern generation has been performed by PLATYPUS on a large number of industrial PLA\´s.
  • Keywords
    Automatic testing; Compaction; Logic arrays; Logic testing; Minimization methods; Power system modeling; Programmable logic arrays; Redundancy; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.1986.1270233
  • Filename
    1270233