DocumentCode
914944
Title
Evaluating layout area tradeoffs for high level applications
Author
Kurdahi, Fadi J. ; Ramachandran, Champaka
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
Volume
1
Issue
1
fYear
1993
fDate
3/1/1993 12:00:00 AM
Firstpage
46
Lastpage
55
Abstract
The authors address the problem of evaluating area tradeoffs for VLSI layouts from high-level specifications (typically register-transfer level). An area prediction approach based on two models, analytical and constructive, are presented. A circuit design is partitioned recursively down to a level specified by the user, thus generating a slicing tree. An analytical model is then used to predict the shape function of each of the leaf subcircuits. By traversing the tree in post-order, the shape function of the entire layout design can be predicted constructively. This approach also permits the user to trade off the accuracy of the prediction versus the runtime of the predictor. Such a scheme is quite useful for high level design tasks. The authors show experimentally that the estimates obtained using this model are within 5% of the actual layout area for designs ranging from 125 to 12000 cells.<>
Keywords
VLSI; cellular arrays; circuit layout CAD; VLSI layouts; analytical model; area prediction; cellular arrays; circuit design; constructive model; high level applications; high level design tasks; high-level specifications; layout area tradeoffs; leaf subcircuits; partitioning; register-transfer level; slicing tree; Accuracy; Analytical models; Circuit synthesis; Costs; Phase estimation; Predictive models; Process design; Runtime; Shape; Very large scale integration;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/92.219906
Filename
219906
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