DocumentCode :
915020
Title :
Automatic testing of high resolution time digitizers
Author :
Kolbe, William F. ; Turko, Bojan
Author_Institution :
Lawrence Berkeley Lab., California Univ., Berkeley, CA, USA
Volume :
35
Issue :
1
fYear :
1988
Firstpage :
187
Lastpage :
190
Abstract :
An automated system for the testing and performance evaluation of high-resolution, long-range time digitizers is described. The test system uses an IBM PC/XT or PC/AT personal computer together with appropriate hardware interfacing modules to control the digitizer under test. Precise timing intervals for testing are generated by a pulse-calibration module driven by a programmable low-phase-noise frequency synthesizer. The time intervals measured by the digitizer are compared under computer control with the actual intervals produced by the synthesizer for a sufficient number of cases to establish the digitizer performance. The hardware and software components used are discussed.<>
Keywords :
analogue-digital conversion; automatic test equipment; electronic equipment testing; microcomputer applications; time measurement; IBM PC/XT; PC/AT; automated system; electronic equipment testing; high resolution time digitizers; performance evaluation; programmable low-phase-noise frequency synthesizer; pulse-calibration module; testing; Automatic control; Automatic testing; Control systems; Frequency synthesizers; Hardware; Microcomputers; Pulse generation; System testing; Time measurement; Timing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.12703
Filename :
12703
Link To Document :
بازگشت