• DocumentCode
    915173
  • Title

    Techniques for time-domain analysis of L.S.I. circuits

  • Author

    Sangiovanni-Vincentelli, A.L. ; Rabbat, N.B.G.

  • Author_Institution
    IBM, T.J. Watson Research Center, Yorktown Heights, USA
  • Volume
    127
  • Issue
    6
  • fYear
    1980
  • fDate
    12/1/1980 12:00:00 AM
  • Firstpage
    292
  • Lastpage
    301
  • Abstract
    The concept of nested macromodels is introduced to take advantage of the structural properties of large-scale integrated circuits. A multilevel algorithm for the analysis of circuits contanining nested macro-models is presented and its implementation is discussed.
  • Keywords
    circuit analysis computing; large scale integration; semiconductor device models; time-domain analysis; LSI circuits; multilevel algorithm; nested macromodels; time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Electronic Circuits and Systems, IEE Proceedings G
  • Publisher
    iet
  • ISSN
    0143-7089
  • Type

    jour

  • DOI
    10.1049/ip-g-1:19800049
  • Filename
    4644691
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=915173