DocumentCode :
915434
Title :
Experimental observations of gated field emitter failures
Author :
Browning, Jim ; McGruer, Nicol E. ; Bintz, W.J. ; Gilmore, M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Volume :
13
Issue :
3
fYear :
1992
fDate :
3/1/1992 12:00:00 AM
Firstpage :
167
Lastpage :
169
Abstract :
Intrinsic failure events in gated field emitters have been studied. The gate-emitter voltage, typically 140 V during operation, drops to 10-70 V at the onset of the failure. Measurements with a diagnostic probe indicate that plumes of ions and electrons are ejected into vacuum with the ion current typically 10% of the electron current. The arc voltage and the ion-to-electron current ratio are characteristic of a cathodic vacuum arc. For series resistors less than 1 k Omega , the arc is continuous, whereas for series resistors greater than 10 k Omega , the arc is intermittent.<>
Keywords :
arcs (electric); electron field emission; failure analysis; vacuum microelectronics; 10 to 70 V; 140 V; Si-SiO/sub 2/-Al; arc voltage; cathodic vacuum arc; diagnostic probe; electron current; electron plumes; gate-emitter voltage; gated field emitter failures; intrinsic failure events; ion current; ion plumes; ion-to-electron current ratio; series resistors; vacuum field emitters; Aluminum; Capacitance; Coaxial components; Current measurement; Electrons; Probes; Resistors; Silicon; Testing; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.144999
Filename :
144999
Link To Document :
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