DocumentCode
915502
Title
Experimental Measurement of Microstrip Transistor-Package Parasitic Reactances
Author
Akello, Robert J. ; Easter, Brian ; Stephenson, I.M.
Volume
25
Issue
5
fYear
1977
fDate
5/1/1977 12:00:00 AM
Firstpage
367
Lastpage
372
Abstract
A resonance method of measurement is described for the determination of the parasitic reactance of a microwave transistor package mounted in microstrip. Results for two types of package obtained from normal-sized and from scaled-up models are presented. The influence of the parasitic on the characteristics of a typical microwave FET chip is briefly discussed.
Keywords
Circuits; Electronics packaging; Ferrites; Microstrip; Microwave FETs; Microwave devices; Microwave measurements; Microwave theory and techniques; Resonance; Semiconductor device packaging;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1977.1129105
Filename
1129105
Link To Document