Title :
Simple model for charge-coupled devices
Author :
Jayadevaiah, T.S. ; Laur, J.
Author_Institution :
University of Wisconsin-Milwaukee, Laboratory for Surface Studies and College of Applied Science & Engineering, Milwaukee, USA
Abstract :
A theory for charge-coupled devices has been developed, based on the transient nature of charge flow in these devices. It has been shown that the limiting factor in charge-transport processes is that of diffusion, which gives a typical time of 10¿8 s for 90% of charge transfer.
Keywords :
carrier density; diffusion; semiconductor device models; semiconductor devices; carrier density; charge coupled devices; charge transfer; diffusion; semiconductor device models; transient nature of charge flow;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19710514
