• DocumentCode
    915584
  • Title

    Microwave transmission method for measuring minority-carrier lifetime in silicon slices

  • Author

    Thomas, R.E. ; Makios, V. ; Ogletree, S. ; Mckillican, R.

  • Author_Institution
    Carleton University, Faculty of Engineering, Ottawa, Canada
  • Volume
    7
  • Issue
    25
  • fYear
    1971
  • Firstpage
    754
  • Lastpage
    756
  • Abstract
    A microstrip transmission method is described for measuring minority-carrier lifetime in thin silicon slices. This method is used to correct results published earlier by Makios and Thomas, using the HP 8410 network analyser as a microwave interferometer. Measured results for high-resistivity samples are shown to extend the earlier curves of Ross and Madigan.
  • Keywords
    microwave measurement; semiconductor materials; Si clices; microwave transmission method; minority carrier lifetime measurement; semiconductor materials;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19710516
  • Filename
    4235423
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=915584