DocumentCode :
915805
Title :
VLSI reliability challenges: from device physics to wafer scale systems
Author :
Takeda, Eiji ; Ikuzaki, Kunihiko ; Katto, Hisao ; Ohji, Yuzuru ; Hinode, Kenji ; Hamada, Akemi ; Sakuta, Toshiyuki ; Funabiki, Takahiro ; Sasaki, Toshio
Author_Institution :
Hitachi Ltd., Tokyo, Japan
Volume :
81
Issue :
5
fYear :
1993
fDate :
5/1/1993 12:00:00 AM
Firstpage :
653
Lastpage :
674
Abstract :
The philosophical and practical differences between Japanese and US IC industries in regard to VLSI reliability, as well as recent research topics and new analysis methods such as wafer scale testing, are discussed. It is suggested that a new approach to VLSI reliability is needed in response to the paradigm shift being brought about by simple scaling limitations, increased process complexity and application of VLSI to advanced systems. An example of this shift is the movement from simple failure analysis by sampling the output of a manufacturing line to the building-in-reliability approach. To introduce and expand on the building-in reliability approach in VLSIs, the authors discuss the required deeper physical understanding of such important processes as hot-carrier effects, dielectrics and metallization
Keywords :
VLSI; circuit reliability; dielectric thin films; failure analysis; hot carriers; integrated circuit manufacture; integrated circuit technology; integrated circuit testing; metallisation; reviews; Japanese IC industry; US IC industry; VLSI reliability; WSI; device physics; dielectrics; failure analysis; hot-carrier effects; manufacturing line; metallization; process complexity; wafer scale systems; wafer scale testing; Costs; Electronics industry; Fabrication; Failure analysis; HEMTs; MOSFETs; Physics; Sampling methods; Transistors; Very large scale integration;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/5.220898
Filename :
220898
Link To Document :
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