All-Optoelectronic Terahertz Imaging Systems and Examples of Their Application

Author

Löffler, Torsten ; Siebert, Karsten J. ; Hasegawa, Noboru ; Hahn, Tobias ; Roskos, Hartmut G.

Author_Institution

JWG Univ.Frankfurt, Frankfurt

Volume

95

Issue

8

fYear

2007

Firstpage

1576

Lastpage

1582

Abstract

We give an overview over several all-optoelectronic measurement systems which we have developed for transmittive and reflective imaging in the terahertz (THz) frequency range. The systems employ either pulsed or continuous-wave THz radiation. In both cases, they work on the basis of single-pixel scanning. Addressing the potential for imaging in the medical and dental field, and the application of THz radiation for industrial surface and interface characterization, we explore dark-field imaging where the imaging contrast originates from diffraction and scattering effects coming from topography or refractive-index variations.

Keywords

integrated optoelectronics; light diffraction; refractive index; submillimetre wave imaging; all-optoelectronic measurement systems; all-optoelectronic terahertz imaging systems; continuous-wave THz radiation; dark-field imaging; diffraction effects; imaging contrast; industrial surface; interface characterization; pulsed THz radiation; reflective imaging; refractive-index variations; scattering effects; single-pixel scanning; terahertz frequency range; topography variations; transmittive imaging; Biomedical imaging; Lasers and electrooptics; Optical imaging; Optical pulses; Optical receivers; Optical refraction; Pulse amplifiers; Radiation detectors; Semiconductor lasers; Surface emitting lasers; Imaging; optoelectronic; terahertz;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/JPROC.2007.898901

Filename

4337846