Accelerated aging of extruded dielectric power cables. II. Life testing of 15 kV XLPE-insulated cables

Author

Bernstein, Bmce S. ; Thue, William A. ; Walton, Mark D. ; Smith, John T., III

Author_Institution

Electr. Power Res. Inst., Washington, DC, USA

Volume

7

Issue

2

fYear

1992

fDate

4/1/1992 12:00:00 AM

Firstpage

603

Lastpage

608

Abstract

For pt.I see ibid., vol.7, no.2, p.596-602 (1992). Preliminary results are described in which 15 kV XLPE cables were subjected to accelerated aging tests under a variety of controlled voltage stress and thermal load cycle conditions, with loss of life being calculated for each set of conditions in terms of the geometric mean time to failure (GMTF). The relative influence of voltage stress and load cycle temperature are discussed. Accelerated aging results show a reduction in GMTF for 15 kV XLPE-insulated cables as the voltage stress or conductor load cycle temperature is increased in a controlled manner. The relative influence of voltage stress versus load cycle temperature can be compared. The GMTF increases more in going from 90°C to 60°C at constant applied voltage stress than in going from 4X to 2X rated voltage at constant load cycle temperature conditions

Keywords

cable insulation; cable testing; life testing; organic insulating materials; polymers; power cables; 15 kV; XLPE-insulated cables; accelerated aging tests; extruded dielectric power cables; geometric mean time to failure; life testing; thermal load cycle; voltage stress; Accelerated aging; Conductors; Dielectrics; Life testing; Power cables; Stress control; Temperature; Thermal loading; Thermal stresses; Voltage control;

fLanguage

English

Journal_Title

Power Delivery, IEEE Transactions on

Publisher

ieee

ISSN

0885-8977

Type

jour

DOI

10.1109/61.127055

Filename

127055