• DocumentCode
    916216
  • Title

    Constant-ratio-coupled multi-grain digital synchronizer with flexible input-output delay selection for versatility in low-power applications

  • Author

    Sasaki, Yasuhiko ; Kato, Naoki ; Nakaya, Hiroaki

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    41
  • Issue
    5
  • fYear
    2006
  • fDate
    5/1/2006 12:00:00 AM
  • Firstpage
    1092
  • Lastpage
    1099
  • Abstract
    The constant-ratio-coupled multi-grain digital synchronizer (CRC-MGsynchronizer) is proposed as a means for making high-speed connections with very low power consumption, both among multiple chips such as processors, controllers, and storage devices, and among on-chip modules. The synchronizer not only provides a wide range of operating frequencies, but is fast locking and only occupies a small area on chip. Therefore, it contributes to large reductions in power consumption and costs. It is suitable for use in various low-power systems (e.g., battery-hungry mobile appliances and low-cost consumer electronic products). Three major techniques were applied to the design: 1)a multi-grain structure for the delay elements, which greatly reduces the number of gates while facilitating locking in a very small number of clock cycles;2) constant-ratio-coupled (CRC) delay lines (measurement versus generation)for flexible selection of the input-output delay; and 3) a new lock stage decision circuit (LSDC) scheme, conferring excellent testability. Moreover,the architecture is all-digital, and thus it has high process portability. By applying these techniques to a DDR memory interface circuit for a mobile application processor fabricated in 130-nm technology, we were able to reduce power consumption by 42% and chip area by 65% compared with a conventional implementation. Furthermore, the novel design spans a frequency range covering 12 times the minimum frequency.
  • Keywords
    digital circuits; low-power electronics; synchronisation; 130 nm; CRC-MG synchronizer; DDR memory interface circuit; clock cycles; constant-ratio-coupled; delay elements; delay-locked loops; fast locking; flexible input-output delay selection; lock stage decision circuit; low-power applications; low-power synchronizer; low-power systems; mobile application processor; multi-grain digital synchronizer; phase-locked loops; Circuit testing; Clocks; Consumer electronics; Costs; Cyclic redundancy check; Delay; Energy consumption; Frequency synchronization; Home appliances; Process control; Delay-locked loops; low-power synchronizer; phase-locked loops;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2006.872870
  • Filename
    1624398