DocumentCode
917103
Title
The autocovariance least-squares method for estimating covariances: application to model-based control of chemical reactors
Author
Odelson, Brian J. ; Lutz, Alexander ; Rawlings, James B.
Author_Institution
BP, Res. & Technol., USA
Volume
14
Issue
3
fYear
2006
fDate
5/1/2006 12:00:00 AM
Firstpage
532
Lastpage
540
Abstract
This paper demonstrates the autocovariance least-squares (ALS) technique on two chemical reactor control problems. The method uses closed-loop process data to recover the covariances of the disturbances entering the process, which are required for state estimation. The data used for this purpose may be collected with or without the controllers running. We do not assume that the plant is at steady state nor that only nonzero disturbances are affecting the plant at the time of data collection. The ALS method also accounts for integrated white noise disturbances, which are required for offset-free control. Two examples are provided in this paper: a carefully controlled laboratory reactor and an industrial reactor controlled by a state-of-the-art advanced model predictive control (MPC) system. A variety of control scenarios are tested and the results demonstrate that the ALS method has the potential to improve the best industrial practice of process control by a factor of three to five.
Keywords
chemical reactors; closed loop systems; covariance analysis; least squares approximations; predictive control; process control; state estimation; white noise; autocovariance least squares method; chemical reactors control; closed loop process data; covariance estimation; integrated white noise disturbance; model predictive control system; process control; state estimation; Chemical reactors; Electrical equipment industry; Inductors; Industrial control; Laboratories; Predictive control; Predictive models; State estimation; Steady-state; White noise; Covariance matrices; disturbance model; industrial control; optimal control; state estimation;
fLanguage
English
Journal_Title
Control Systems Technology, IEEE Transactions on
Publisher
ieee
ISSN
1063-6536
Type
jour
DOI
10.1109/TCST.2005.860519
Filename
1624478
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