Title :
Error rate for p.s.k. and d.p.s.k. in the presence of source noise
Author :
Richmond, I.M. ; Thumwood, R.F.
Author_Institution :
Microwave Associates Ltd., Luton, UK
Abstract :
The analysis of error rate in 2-level p.s.k. and d.p.s.k. systems has been extended to include the effects of source phase noise. Curves are presented for channel S/N ratios up to 6 dB and source phase deviations up to 0.6 rad r.m.s.
Keywords :
error statistics; noise; phase shift keying; S/N ratios; error statistics; phaseshift keying; source noise;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19720154
