DocumentCode :
917476
Title :
HiSIM2 Circuit simulation - Solving the speed versus accuracy crisis
Author :
Mattausch, H.J. ; Miyake, M. ; Navarro, D. ; Sadachika, N. ; Ezaki, T. ; Miura-Mattausch, M. ; Yoshida, T. ; Hazama, S.
Author_Institution :
Graduate Sch. of Adv. Sci. of Matter, Hiroshima Univ., Higashi
Volume :
22
Issue :
5
fYear :
2006
Firstpage :
29
Lastpage :
38
Abstract :
The development trend in compact modeling goes toward surface-potential-based approaches and leads to models like HiSIM2, with higher accuracy, fewer model parameters, and shorter computer runtime than achievable with the conventional threshold-voltage-based approaches. The main motivation for continuing this development effort is to realize a sufficient design capability of RF circuits with advanced MOSFETs, where many higher-order phenomena affect the circuit performance, as well as of large mixed-signal circuits, where both accuracy and short simulation time are a must. The trend toward the surface potential brings compact modeling for circuit simulation also much closer to 2D and three-dimensional numerical device simulation. Therefore, both approaches can now come together and work united to achieve the common goal of realizing rapid technology progress for the benefit of the society
Keywords :
circuit simulation; field effect integrated circuits; integrated circuit modelling; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; HiSIM2; MOSFET; RF circuits; circuit simulation; compact modeling; computer runtime; mixed-signal circuits; model parameters; numerical device simulation; surface potential approaches; threshold voltage approaches; Circuit simulation; Coupling circuits; Intrusion detection; MOSFETs; Microscopy; Neodymium; Physics; Poisson equations; Predictive models; Radio frequency;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.2006.272998
Filename :
4049879
Link To Document :
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