• DocumentCode
    917534
  • Title

    Comments on "Experimental Measurement of Microstrip Transistor Package Parasitic Reactance" [Letters]

  • Author

    Beneking, H.

  • Volume
    26
  • Issue
    1
  • fYear
    1978
  • Firstpage
    43
  • Lastpage
    43
  • Abstract
    In the above paper, Akello et al. describe a method for experimental determination of the parasitic of microstrip-transistor packages, based on a resonance principle. A different method of measuring small reactances and susceptances, also permitting the determination of transistor-package elements based on time-dornain techniques, is given by Piller in [1]. This method avoids the difficulties resulting from critical coaxial to microstrip transitions.
  • Keywords
    Coaxial components; Electronics packaging; Equivalent circuits; Microstrip; Resonance; Semiconductor device packaging; Seminars; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1978.1129305
  • Filename
    1129305