DocumentCode :
917534
Title :
Comments on "Experimental Measurement of Microstrip Transistor Package Parasitic Reactance" [Letters]
Author :
Beneking, H.
Volume :
26
Issue :
1
fYear :
1978
Firstpage :
43
Lastpage :
43
Abstract :
In the above paper, Akello et al. describe a method for experimental determination of the parasitic of microstrip-transistor packages, based on a resonance principle. A different method of measuring small reactances and susceptances, also permitting the determination of transistor-package elements based on time-dornain techniques, is given by Piller in [1]. This method avoids the difficulties resulting from critical coaxial to microstrip transitions.
Keywords :
Coaxial components; Electronics packaging; Equivalent circuits; Microstrip; Resonance; Semiconductor device packaging; Seminars; Time domain analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1978.1129305
Filename :
1129305
Link To Document :
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