DocumentCode
917534
Title
Comments on "Experimental Measurement of Microstrip Transistor Package Parasitic Reactance" [Letters]
Author
Beneking, H.
Volume
26
Issue
1
fYear
1978
Firstpage
43
Lastpage
43
Abstract
In the above paper, Akello et al. describe a method for experimental determination of the parasitic of microstrip-transistor packages, based on a resonance principle. A different method of measuring small reactances and susceptances, also permitting the determination of transistor-package elements based on time-dornain techniques, is given by Piller in [1]. This method avoids the difficulties resulting from critical coaxial to microstrip transitions.
Keywords
Coaxial components; Electronics packaging; Equivalent circuits; Microstrip; Resonance; Semiconductor device packaging; Seminars; Time domain analysis;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1978.1129305
Filename
1129305
Link To Document