Title :
Concurrent detection of erroneous responses in linear analog circuits
Author :
Stratigopoulos, Haralampos-G D. ; Makris, Yiorgos
Author_Institution :
Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
fDate :
5/1/2006 12:00:00 AM
Abstract :
This paper presents a novel methodology for concurrent error detection in linear analog circuits. The error-detection circuit monitors the input and some observable internal nodes of the examined circuit and generates an estimate of its output. The estimate coincides with the output in error-free operation, while in the presence of errors, it diverges. Thus, concurrent error detection is performed by comparing the two signals through an analog comparator. In essence, the error-detection circuit operates as a duplicate of the examined circuit, yet it is smaller, in general, and never exceeds the size of an actual duplicate. The proposed methodology is demonstrated on three analog filters.
Keywords :
analogue circuits; circuit testing; comparators (circuits); error detection; filters; analog comparator; analog filters; analog test; concurrent detection; erroneous responses; error detection circuit; error-free operation; linear analog circuits; Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Error-free operation; Fault detection; Filters; Manufacturing; Monitoring; System testing; Analog test; concurrent error detection; linear analog circuits; state observation;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2005.855962