Title :
The Psychology of Electronic Test
Author :
Davidson, Scott ; Davidson, Helen
Author_Institution :
Sun Microsyst., Sunnyvale
Abstract :
Test-related decisions have important consequences for product cost, quality, reliability, and information gathering. Yet, the persons making those decisions are - like all of us - imperfect. This article suggests ways to improve our understanding of our own decision making with an eye toward making the best choices possible in the area of electronic test.
Keywords :
decision making; electronic equipment testing; industrial psychology; production testing; psychometric testing; decision making; electronic test psychology; test-related decision; Automatic test pattern generation; Automatic testing; Computer aided manufacturing; Consumer electronics; Design engineering; Electronic equipment testing; Power generation economics; Psychology; Sun; Test pattern generators; DFT engineers; designers; psychological factors; psychology of electronic test; test engineers;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2007.175
