• DocumentCode
    917592
  • Title

    The Psychology of Electronic Test

  • Author

    Davidson, Scott ; Davidson, Helen

  • Author_Institution
    Sun Microsyst., Sunnyvale
  • Volume
    24
  • Issue
    5
  • fYear
    2007
  • Firstpage
    494
  • Lastpage
    501
  • Abstract
    Test-related decisions have important consequences for product cost, quality, reliability, and information gathering. Yet, the persons making those decisions are - like all of us - imperfect. This article suggests ways to improve our understanding of our own decision making with an eye toward making the best choices possible in the area of electronic test.
  • Keywords
    decision making; electronic equipment testing; industrial psychology; production testing; psychometric testing; decision making; electronic test psychology; test-related decision; Automatic test pattern generation; Automatic testing; Computer aided manufacturing; Consumer electronics; Design engineering; Electronic equipment testing; Power generation economics; Psychology; Sun; Test pattern generators; DFT engineers; designers; psychological factors; psychology of electronic test; test engineers;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2007.175
  • Filename
    4338472