DocumentCode
917618
Title
Book Reviews: Test Tutorials in Book Form
Author
Davidson, Scott
Author_Institution
Sun Microsystems
Volume
24
Issue
5
fYear
2007
Firstpage
506
Lastpage
507
Abstract
This is a review of Advances in Electronic Testing: Challenges and Methodologies (edited by Dimitris Gizopoulos), which is part of a series called Frontiers in Electronic Testing. This book can be thought of as a set of advanced tutorials in book form. One of the best things about this book is that several chapters go beyond the what of the subject and into the why. The book is also well integrated, with pointers to other chapters when necessary and with a minimum overlap between chapters.
Keywords
Application software; Book reviews; Built-in self-test; Computer architecture; Costs; Delay; Design for testability; Electronic equipment testing; Radio frequency; Sections; ATE; DFT; advances in electronic testing; methodologies; tutorials;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2007.154
Filename
4338475
Link To Document