• DocumentCode
    917618
  • Title

    Book Reviews: Test Tutorials in Book Form

  • Author

    Davidson, Scott

  • Author_Institution
    Sun Microsystems
  • Volume
    24
  • Issue
    5
  • fYear
    2007
  • Firstpage
    506
  • Lastpage
    507
  • Abstract
    This is a review of Advances in Electronic Testing: Challenges and Methodologies (edited by Dimitris Gizopoulos), which is part of a series called Frontiers in Electronic Testing. This book can be thought of as a set of advanced tutorials in book form. One of the best things about this book is that several chapters go beyond the what of the subject and into the why. The book is also well integrated, with pointers to other chapters when necessary and with a minimum overlap between chapters.
  • Keywords
    Application software; Book reviews; Built-in self-test; Computer architecture; Costs; Delay; Design for testability; Electronic equipment testing; Radio frequency; Sections; ATE; DFT; advances in electronic testing; methodologies; tutorials;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2007.154
  • Filename
    4338475