DocumentCode
917640
Title
DATE 07 workshop on diagnostic services in NoCs
Author
Jan Marinissen, Erik ; Jantsch, Axel ; Nicolici, Nicola
Author_Institution
NXP Research
Volume
24
Issue
5
fYear
2007
Firstpage
510
Lastpage
510
Abstract
The Workshop on Diagnostic Services in Network-on-Chips, held during DATE 2007, focused on test, debugging, and online monitoring in NoCs. The main body of the workshop was formed by two sessions with full-length paper presentations and two lively poster sessions with a total of 28 posters. EPFL´s Giovanni De Micheli gave the keynote address, and the workshop also featured a panel session led by Tensilica´s Grant Martin and invited talks by Virage Logic´s Yervant Zorian and NXP Semiconductors´ Kees Goossens. The workshop produced electronic online proceedings, including papers, slides, and posters-totaling 420 pages.
Keywords
DATE 2007; NoC; diagnostic services; network on chip;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2007.162
Filename
4338477
Link To Document