DocumentCode :
917640
Title :
DATE 07 workshop on diagnostic services in NoCs
Author :
Jan Marinissen, Erik ; Jantsch, Axel ; Nicolici, Nicola
Author_Institution :
NXP Research
Volume :
24
Issue :
5
fYear :
2007
Firstpage :
510
Lastpage :
510
Abstract :
The Workshop on Diagnostic Services in Network-on-Chips, held during DATE 2007, focused on test, debugging, and online monitoring in NoCs. The main body of the workshop was formed by two sessions with full-length paper presentations and two lively poster sessions with a total of 28 posters. EPFL´s Giovanni De Micheli gave the keynote address, and the workshop also featured a panel session led by Tensilica´s Grant Martin and invited talks by Virage Logic´s Yervant Zorian and NXP Semiconductors´ Kees Goossens. The workshop produced electronic online proceedings, including papers, slides, and posters-totaling 420 pages.
Keywords :
DATE 2007; NoC; diagnostic services; network on chip;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2007.162
Filename :
4338477
Link To Document :
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