DocumentCode :
918467
Title :
Domain velocity in thin Gunn diodes
Author :
Tucker, T.W.
Volume :
59
Issue :
7
fYear :
1971
fDate :
7/1/1971 12:00:00 AM
Firstpage :
1116
Lastpage :
1117
Abstract :
An extension to the small-signal analysis of Kino and Robson indicates that domain velocity in thin Gunn diodes decreases as diode thickness decreases or as surface dielectric loading increases.
Keywords :
Circuit testing; Diodes; Dispersion; Displays; Equations; Gunn devices; Hafnium; Permittivity; RLC circuits; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1971.8341
Filename :
1450271
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=918467
