DocumentCode
918564
Title
Comments on "A new look at yield of integrated circuits"
Author
Murphy, B.T.
Author_Institution
Bell Labs., Murray Hill, N. J.
Volume
59
Issue
7
fYear
1971
fDate
7/1/1971 12:00:00 AM
Firstpage
1128
Lastpage
1128
Keywords
Circuit testing; Integrated circuit yield; Pulse circuits; Pulse transformers; Pulsed power supplies; Quantum mechanics; Resists; Silicon; Temperature distribution; Wave functions;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1971.8351
Filename
1450281
Link To Document