DocumentCode :
918564
Title :
Comments on "A new look at yield of integrated circuits"
Author :
Murphy, B.T.
Author_Institution :
Bell Labs., Murray Hill, N. J.
Volume :
59
Issue :
7
fYear :
1971
fDate :
7/1/1971 12:00:00 AM
Firstpage :
1128
Lastpage :
1128
Keywords :
Circuit testing; Integrated circuit yield; Pulse circuits; Pulse transformers; Pulsed power supplies; Quantum mechanics; Resists; Silicon; Temperature distribution; Wave functions;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1971.8351
Filename :
1450281
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=918564
