DocumentCode
918623
Title
Simulation of Pt-n-p+ silicon punchthrough device
Author
Stewart, J.A.C. ; Wakefield, J.
Author_Institution
Queen´s University of Belfast, Department of Electrical & Electronic Engineering, Belfast, UK
Volume
8
Issue
15
fYear
1972
Firstpage
378
Lastpage
379
Abstract
The small-signal impedance of a Pt-n-p+ device has been computed using a model which describes in detail the physical mechanisms in the depleted n region. The small-signal negative resistance is shown to be both frequency- and temperature-dependent at a given bias-current density.
Keywords
electrical impedance; microwave devices; negative resistance effects; semiconductor device models; simulation; Pt-n-p silicon structure; microwave device; negative resistance effects; punchthrough injection device; semiconductor device models; simulation; small signal impedance analysis;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19720276
Filename
4235733
Link To Document