• DocumentCode
    918649
  • Title

    Quantification of Damage due to Surface Tracking

  • Author

    Rajini, V. ; Kumar, K. Udaya

  • Author_Institution
    S.S.N Coll. of Eng., Chennai
  • Volume
    14
  • Issue
    5
  • fYear
    2007
  • fDate
    10/1/2007 12:00:00 AM
  • Firstpage
    1224
  • Lastpage
    1231
  • Abstract
    Fractals have been very successfully used to address the problem of modeling and to provide a description of naturally occurring phenomena and shapes, wherein conventional and existing mathematical models were found to be inadequate. The geometrical patterns of dielectric breakdown like electrical trees, surface discharges, and lightning are known to be of fractal in nature. These fractal patterns can be analyzed numerically using fractal dimensions and lacunarity. Surface tracking occurring in HV insulation systems is a very complex phenomenon and more so are the shapes of tracking patterns. It has been fairly well established that the shapes and the underlying parameters causing tracking have a 1:1 correspondence and therefore methods to describe and quantify these patterns must be explored. This contribution reports preliminary results of such a study wherein 2D tracking patterns of gamma irradiated ethylene propylene diene monomer (EPDM) were analyzed and found to posses´ fairly reasonable pattern discriminating abilities.
  • Keywords
    ceramic insulators; fractals; insulation testing; polyethylene insulation; surface discharges; trees (electrical); EPDM; HV insulation systems; ceramic insulators; dielectric breakdown; electrical trees; ethylene propylene diene monomer; fractal dimensions; fractal patterns; surface discharges; surface tracking; Dielectric breakdown; Dielectrics and electrical insulation; Fractals; Insulation life; Lightning; Mathematical model; Pattern analysis; Shape; Surface discharges; Trees - insulation;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2007.4339483
  • Filename
    4339483