DocumentCode
918914
Title
Testable switched-capacitor filters
Author
Huertas, José L. ; Rueda, Adoración ; Vázquez, Diego
Author_Institution
Dept. Diseno Analogico, Sevilla Univ., Spain
Volume
28
Issue
7
fYear
1993
fDate
7/1/1993 12:00:00 AM
Firstpage
719
Lastpage
724
Abstract
A design-for-testability (DFT) methodology for switched-capacitor (SC) filters is presented, based on an architecture using some additional circuitry and providing extra capabilities for both off- and online test. A programmable biquad is used for on-chip comparison of the transfer functions for every filter stage. Test area overhead consists of the programmable biquad, a set of switches, and a finite-sequential-machine (FSM) control part. The design and implementation of an example filter are included to assess the potential usefulness of this approach
Keywords
design for testability; network synthesis; switched capacitor filters; transfer functions; FSM control part; design-for-testability; finite-sequential-machine; programmable biquad; switched-capacitor filters; testable SC filters; transfer functions; Built-in self-test; Circuit testing; Design for testability; Design methodology; Filters; Life testing; Prototypes; Signal processing; System testing; Transfer functions;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.222167
Filename
222167
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