DocumentCode :
919042
Title :
Computer-Aided Determination of Microwave Two-Port Noise Parameters
Author :
Giuseppe, C. ; Sannino, Mario
Volume :
26
Issue :
9
fYear :
1978
fDate :
9/1/1978 12:00:00 AM
Firstpage :
639
Lastpage :
642
Abstract :
The least-squares fit of measured noise figures as a function of source admittance is an accurate and rapid method also convenient from the experimental point of view, to determine linear two-port noise parameters. However, to avoid the erroneous results often obtained by experimenters, this paper presents some criteria to be followed in choosing the proper source admittances. In order to apply the method to microwave two-ports, a relationship relating noise parameters in a linearized form is introduced. The analytical developments are in terms of effective input noise temperature of the two-port. Experimental. results for a microwave transistor are also reported as a function of experimental redundancy.
Keywords :
Admittance measurement; Computer graphics; Curve fitting; Equations; Microwave theory and techniques; Microwave transistors; Noise figure; Noise measurement; Redundancy; Temperature;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1978.1129454
Filename :
1129454
Link To Document :
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